마이크로파 근접장 가열을 통한 근접장 영상화 현미경 (microwave neafield microscope based on optical indicator and nearfield heating)

판매 대리인 : 기율특허

전화번호 : 02-782-1004

메일주소 : kiyul@kiyul.co.kr

영문 원어  : The present invention relates to a microscope imaging near-field by heating microwave near-field, comprising: a microscope unit which circularly polarizes light and irradiates the light into a target object, and analyzes a reflected light to image heat distribution; and an indicator positioned on an upper part of the target object, generating thermal stress by heat wherein the irradiated light entered into the target object occurs a double refraction by the thermal stress when the indicator due to heat generated in the target object, thereby imaging heat distribution optically using the indicator.